Modeling and Analysis of Profiled Reliability Tests using Computation-Intensive Statistical Methods
| Category | Publications |
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| Abstract | Supported by the IREE funding, three ASU researchers visited the Department of Industrial and Systems Engineering of the National University of Singapore (NUS) during the summer of 2008. During the visit, we collaborated with Dr. Min Xie, Dr. L.C. Tang and their students on two main research topics: 2) to apply design of experiments on accelerated life testing and 2) to explore the use of generalized additive models on modeling and analysis of accelerated degradation testing data. As a result of this experience, the ASU and NUS researchers were able to foster a truly collaborative relationship. This included sharing and brainstorming of ideas, open discussion and presentation of competing views and perspectives, ideas, and review of best practices. The international research training had motivated the students to pursue more advanced education and academic careers. To continue this collaboration, our NUS partners had submitted a proposal to the Ministry of Education of Singapore to seek funding for inviting the PI to revisit the university in the future. In addition, the benefits extended to include cultural experiences associated with a rich multi-cultural university such as NUS. |
| Contributor | Mourad Ouzzani
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| Bio | Rong Pan is an Assistant Professor of Industrial Engineering at Arizona State University. He received his PhD in Industrial Engineering from Penn State University in 2002. His research interests include failure time data analysis, design of experiments, multivariate statistical quality control, time-series analysis and control. He is the recipient of the 2008 Stan Ofsthun Award given by the Society of Reliability Engineers. He is a senior member of ASQ and a member of SRE, IIE, and INFORMS.
Eric Monroe holds aMasters degree in Mechanical Engineering from the University of Illinois, Urbana, and is a member of the Mechanical Science & Engineering Alumni Board. He is currently a Staff Engineer and Statistician with 12 years of experience in the semi-conductor industry. As a PhD student at Arizona State University, his current research interests are in reliability analysis, experimental design, data mining and generalized linear models. |
| Cite this work | Researchers should cite this work as follows: Rong Pan, "Modeling and Analysis of Profiled Reliability Tests using Computation-Intensive Statistical Methods", Trip report presented at the NSF IREE 2008 Grantees Conference, May 2008, Washington, D.C. |
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